Technology

Advanced manufacturing demands automated, advanced NDE solutions

Next-generation NDE enables new capabilities: in-situ inspection of large structures, fast contactless high-resolution scanning, defect measurement, vision into high-attenuating materials and NDE digital twins.

Single-sided x-ray backscatter
Single-sided laser ultrasound
Thru-transmission laser ultrasound
Thermography
Shearography
XRF / XRD
Photon counting x-ray CT
CMM
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Single-sided x-ray backscatter

Single-sided laser ultrasound

Thru-transmission laser ultrasound

Thermography

Shearography

XRF / XRD

Photon counting x-ray CT

CMM

High resolution, comparable with micro CT 50 μm voxel resolution standard

  • Can scan large objects not possible with conventional microCT systems
  • High-energy microfocus x-ray sources (10-150 kVp) allow inspection of very dense materials such as stainless steel and Inconel

CdTe photon counting detectors (PCD)

  • Spectral x-ray material decomposition can identify/subtract materials e.g. copper in lightning strike protection for CFRP structures
  • High conversion efficiency and noise-free operation allows 33% lower kVp as compared with traditional “flat panel” detectors
  • High speed – up to 500 frames per second (15-25x faster than flat panels)
  • Metal artifact reduction

Iterative, arbitrary path reconstruction algorithm

  • Unlimited possible scan geometries
Honeycomb texture

Contactless

  • No gel
  • No problem with curved parts, even tight curves
  • No damage/change to surface of part
  • Can measure porosity using resonance frequency of pores (only possible with Xarion due to their broadband microphone)

Broadband

  • No need for frequency-specific transducers,
 instead post-process using digital filters (e.g. bandpass)
  • Easily analyze frequency-specific defects

Through-Transmission Ultrasound

  • 10x spatial resolution vs. traditional contactless airgap UT
  • Fast scanning, up to 450 sq ft/hr

Single Sided Inspection Head (SSIH or Pitch-Catch)

  • Can detect defects from only one side of the object when interior access is a problem

Can be operated as a Class 1 laser with a 0.8m barrier

Small, portable system

  • Excitation laser from legacy laser UT systems was the size of a car and required significant laser protection
Contactless testing

Backscatter X-ray offers single-sided quasi X-ray CT imaging, a capability that has no competing commercial system available. It can effectively detect air gaps less than 80 µm, including cases like delamination.

Backscatter CT

Surface profilometry provides a high-accuracy surface map, with precision within 25 μm. It is employed to guide the scan trajectory of other modalities.

Laser Surface Profiling

The system is capable of imaging the strain field
 to identify local weaknesses and defects, such as delaminations and kissing bonds.

Texture

The portable system features dual-arm geometric synchronization, offering the highest level of accuracy, and it does not require the use of fences or cages.

Omni NDE robotic arm

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Contact us to discuss any opportunities. We look forward to addressing your challenges.

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